A new training opportunity for PhD students and early-career researchers!

Chalmers University of Technology (Gothenburg, Sweden) organises a training on Automated metrology, on 10-12th June 2025.

This short training aims at discovering the facilities at Chalemers and diving into the topic through hands-on activities and teaching with the local staff and experts. Up to 6-8 applicants will be selected and get financial support for participating to the training. You can apply by February 17th 10AM CET.

The programme is opened to PhD, those who completed a PhD two years ago or less. Applicants based in Sweden or at one of the INFRACHIP consortium member can’t apply.

Let’s take a short look at what to expect, as presented by the Chalmers team:

“At Chalmers, we offer hands-on training on advanced automated metrology focusing on specific cases at a wafer scale. Our cleanroom provides a unique opportunity to access automated tools for image acquisition and data analysis which can be included in your process to improve the tracking of your process status over time and reducing the human factor.

Together, we will explore various real-life practical cases, which will guide your understanding of the capabilities of automated characterization.

Ultimately, we would like to create an awareness of how your processes and samples can profit from automated metrology.”

The key topics of the training will be:

•  Introduction to automated metrology procedures
•  Hands-on experience in automated optical microscopy and automated SEM, with focus in particular problems
• Correlation between image-analysis data and physical properties: the case of Josephson Junctions (JJ) in quantum computing
• Defect detection and analysis at wafer scale: the case of CVD-grown stressed films