About

Janis probe test station with Agilent B1505A Tracer and B1513A - B1512A - B1520A - B1510A module for static characterization of power components at different temperatures.

Description

CARAPACE characterization platform was designed accordingly to multidisciplinary requirements between high voltage, high temperature range, optical and electrical constraints. The purpose of this equipment is to accurately measure the static performances of novel power semiconductor devices and their integrated functions. New materials for power electronics such as diamond (C) or Gallium Nitride (GaN) are pushing the limits of the current state of the art in terms of current density, on state losses and dielectric breakdown voltage, operating temperatures and high frequency power applications.

Technical specifications:

The platform is consituted by a Janis station feed by a curve tracer Agilent B1505

Main features of the tracer / station assembly :

– 6 tips – (2 coax / 2 triax / 1 HV/ 1 fiber optic) – (different diameters from a few microns to 100nm)

– Vacuum atmosphere (approx. 5*10-4 mbar) 

– Sample temperature: -200°C to +300°C (possible 400°C)

– Maximum sample size: wafer diameter 60mm

– Voltage: 3000V/4mA(Pulse and DC) – 1500V/8mA(Pulse and DC) – 200V/1A(Pulse) – 40V/1A(Pulse and DC) – 20V/2.5A (Pulse)

– Multi-frequency module (B1520A): 1kHz to 5Mhz

– Resolution on 200V/1A – 10fA rating

Case study:

The purpose of this equipment is to accurately measure the static performances of novel power semiconductor devices and their integrated functions. Ex: Materials for power electronics such as diamond (C) or Gallium Nitride (GaN)….

Access Provider / Facilities

CNRS-FMNT