Terahertz (50 GHz – 4 THz) characterization and imaging of materials and devices by using Time or Frequency Domain methods. Temporally characterization of phenomena and dynamics in the picosecond range.


The PLATERA platform (https://www.platera.tech/) enables us to study the properties of materials and devices at frequencies between 50 GHz and 4 THz, and to temporally characterize phenomena and dynamics in the picosecond range. 

THz waves are highly sensitive to the presence of free charges and to vibrational/rotational modes of molecules (e.g. water vapor). Thus, THz waves are useful for measurement of doping level in semiconductors wafers, dielectric characterization of materials (solid or thin-film), non-destructive testing, etc…. Combined with pulsed laser sources (femtosecond lasers in the UV- VIS- NIR range), THz pulses can also be used to study the dynamics of non-equilibrium systems (optical pump/THz probe experiments) at sub-nanosecond scales. Finally, imaging systems (camera, point-to-point scanned image) combined with the use of broadband or tunable THz sources enable multispectral imaging applications.

For these various applications, the PLATERA platform is equipped with the following instruments:

2 multispectral THz imagers

1 frequency-resolved THz spectroscopy system (50 GHz – 2.5 THz)

2 broadband time-domain-spectroscopy systems (100 GHz – 4 THz)

THz camera

THz power meters

a frequency-tunable single-frequency source (200 GHz- 1 THz)

an optical pump / THz probe time domain characterization bench (with optical pump of 70 fs ranging from 300 nm to 1600 nm)

an experimental bench for measuring picosecond optoelectronic impulse response at 780 or 1560 nm.

Technical specifications:

Frequency range: 50 GHz – 4 THz (typically)

Samples size: mm to several cm


Coutaz, J.-L., Garet, F., & Wallace, V. (2018). Principles of Terahertz Time-Domain Spectroscopy (1st ed.). Jenny Stanford Publishing. https://doi.org/10.1201/b22478

M. Bernier, F. Garet, J. -L. Coutaz, H. Minamide and A. Sato, “Accurate Characterization of Resonant Samples in the Terahertz Regime Through a Technique Combining Time-Domain Spectroscopy and Kramers–Kronig Analysis,” in IEEE Transactions on Terahertz Science and Technology, vol. 6, no. 3, pp. 442-450, May 2016, doi: 10.1109/TTHZ.2016.2535244.

L. Duvillaret, F. Garet and J. . -L. Coutaz, “A reliable method for extraction of material parameters in terahertz time-domain spectroscopy,” in IEEE Journal of Selected Topics in Quantum Electronics, vol. 2, no. 3, pp. 739-746, Sept. 1996, doi: 10.1109/2944.571775.

L. Duvillaret, F. Garet, and J. Coutaz, “Highly precise determination of optical constants and sample thickness in terahertz time-domain spectroscopy,” Appl. Opt. 38, 409-415 (1999).

L. Duvillaret, F. Garet, J. . -F. Roux and J. . -L. Coutaz, “Analytical modeling and optimization of terahertz time-domain spectroscopy experiments, using photoswitches as antennas,” in IEEE Journal of Selected Topics in Quantum Electronics, vol. 7, no. 4, pp. 615-623, July-Sept. 2001, doi: 10.1109/2944.974233.

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