FIB-STEM

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This tool consists of a scanning electronic microscope SEM equipped with a focalized ion beam FThis tool consists of a scanning electronic microscope SEM equipped with a focalized ion beam F...
Access Provider / Facilities
CNRS-FMNT

Characterization

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Scanning Electron Microscope (SEM): ZEISS Supra 60VP Ellipsometer: Philips PQ Ruby Spectral EScanning Electron Microscope (SEM): ZEISS Supra 60VP Ellipsometer: Philips PQ Ruby Spectral E...
Access Provider / Facilities
AMO GmbH