Physical/Structural Archives

Photonic Circuits and Devices

Showroom NCSR Demokritos Devices / Test structures, Dielectric deposition, Dry etching, e-beam lithography, Metal deposition, Metrology / Characterisation, Modelling / Database, Optical, Optical lithography, Physical/Structural, Plasma etching, Processing/Fabrication, Wet etching Advanced sensing, Photonic sensing, Sense

Silicon nitride passive photonic elements, integrated circuits and devices operating in the VIS...

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NCSR Demokritos

Antenna and RF Test and Characterization Suite

Showroom Tyndall Devices / Test structures, Electrical, Magnetic, Mechanical, Metrology / Characterisation, Optical, Physical/Structural Connect, RF components, RF front-end design, Short-range optical communications

This is a suite of test equipment that is suitable for characterizing RF and Microwave circuits...

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Tyndall

Time domain diffuse optical spectrometer (450-1700 nm)

Showroom Tyndall Metrology / Characterisation, Optical, Others, Physical/Structural Advanced sensing, Green electronics and substrates, Green sensors, Hybrid SiP/SoC, Photonic sensing, Sense, Stretchable and flexible sensors, Sustain

Time domain diffuse optical spectrometer will characterize accurately the absorption and reduce...

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Tyndall

X-ray and ultraviolet photoelectron spectroscopy (XPS/UPS)

Showroom UNINOVA Electrical, Metrology / Characterisation, Physical/Structural Advanced sensing, Component Neuromorphic computing, Green electronics and substrates, Green sensors, Hybrid SiP/SoC, Photonic sensing, Quantum and spin devices engineering, Sense, Stretchable and flexible sensors, Sustain, Think

UNINOVA offers characterization of surfaces in terms of chemical (oxidation states) and element...

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UNINOVA

STEM Hitachi HF-5000

Showroom UNINOVA Metrology / Characterisation, Physical/Structural Advanced sensing, Green electronics and substrates, Green sensors, Sense, Sustain

The HF-5000 transmission electron microscope from Hitachi is a 200 kV aberration-corrected CFE ...

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UNINOVA

Scanning Electron Microscopy

Showroom UNINOVA Devices / Test structures, Electrical, Magnetic, Mechanical, Metrology / Characterisation, Optical, Physical/Structural Advanced sensing, Energy autonomy, Green electronics and substrates, Green sensors, Photonic sensing, Power, Power electronics, Sense, Stretchable and flexible sensors, Sustain

UNINOVA offers access to the entire value chain related to SEM analyses of different kinds of s...

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UNINOVA

Atomic Force Microscope (AFM)

Showroom UNINOVA Electrical, Magnetic, Mechanical, Metrology / Characterisation, Physical/Structural Advanced sensing, Component Neuromorphic computing, Energy autonomy, Green electronics and substrates, Green sensors, Power, Quantum and spin devices engineering, Sense, Stretchable and flexible sensors, Sustain, Think

An AFM works by quasi-physically probing a surface, allowing to generate not only topography im...

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UNINOVA

Flexible Microfluidics Fab (FLEXµFLU)

Showroom JOANNEUM RESEARCH Devices / Test structures, Mechanical, Metrology / Characterisation, Modelling / Database, Optical, Optical lithography, Physical/Structural, Processing/Fabrication Green sensors, Sense, Stretchable and flexible sensors, Sustain

Flexible Microfluidics Fab covers the whole development chain for high throughput fabrication o...

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JOANNEUM RESEARCH

Flexible Microoptics Fab (FLEXµOPT)

Showroom JOANNEUM RESEARCH Devices / Test structures, e-beam lithography, Electrical, Mechanical, Metrology / Characterisation, Modelling / Database, Optical, Physical/Structural, Printing, Processing/Fabrication

FLEXµOPT covers the whole development chain for 2D-2.5D freeform microoptical elements on flex...

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JOANNEUM RESEARCH

Printed Sensor Fab (PRINTSENS)

Showroom JOANNEUM RESEARCH Devices / Test structures, Dielectric deposition, Dry etching, e-beam lithography, Electrical, Magnetic, Mechanical, Metal deposition, Metrology / Characterisation, Optical, Optical lithography, Physical/Structural, Plasma etching, Printing, Processing/Fabrication, Wet etching Green sensors, Sense, Stretchable and flexible sensors, Sustain

PRINTSENS covers the whole development chain for printed sensors - design & specification - ...

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JOANNEUM RESEARCH

Photonic Circuits and Devices

Antenna and RF Test and Characterization Suite

Time domain diffuse optical spectrometer (450-1700 nm)

X-ray and ultraviolet photoelectron spectroscopy (XPS/UPS)

STEM Hitachi HF-5000

Scanning Electron Microscopy

Atomic Force Microscope (AFM)

Flexible Microfluidics Fab (FLEXµFLU)

Flexible Microoptics Fab (FLEXµOPT)

Printed Sensor Fab (PRINTSENS)

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