Thin-film circuits for sensors
About
UNINOVA offers the access to the entire value chain related to the design, simulation, fabrication and characterization of circuits based on oxide thin-film transistors (TFTs) for signal conditioning/addressing/processing to couple with sensors, both on rigid and flexible substrates.
Description
Core competences offered:
- Physical level simulation of oxide TFTs with different geometries and materials
- Design, simulation, fabrication and characterization of oxide TFT circuits with low-to-medium complexity, using in-house clean room processes
- Supporting design and simulation of oxide TFT circuits with medium-to-high complexity, making use of commercial PDK for subsequent tapeout requests to external foundry by users
Major tools:
- Silvaco TCAD suite for physics-based simulation of oxide TFTs
- Circuit design and simulation in Cadence environment
- Tools for oxide TFT fabrication and circuit integration, including sputtering, ALD, direct laser writing, etching and nanoimprint lithography. Printing available for low-transistor count circuits
- Failure analysis, including SEM/FIB cross section analysis, EBIC-based techniques, STEM for interfacial analysis
- Electrical characterization of circuits, including semiconductor parameter analyzers with IV, pulsed-IV and CV capabilities, oscilloscopes, signal generators, manual probe stations, probe stations with temperature, light and environmental control
Technical specifications:
Fabrication:
- Glass or flexible substrates (up to 4” size)
- TFT channel length between 200 µm and 600 nm, depending on processing technology
Characterization:
- Up to 2” size for SEM/FIB
- Electrical characterization in probe stations – up to 4” substrate and up to 6 I/O pads (beyond that requires PCB integration)
Case study:
A user has the requirement to have a glass or flexible substrate including all the circuitry required for signal conditioning/addressing/processing of sensors, eventually even integrating both sensors and circuits within the same substrate.
Optional:
https://doi.org/10.1002/aelm.201800032
https://doi.org/10.1109/JEDS.2018.2850219
https://doi.org/10.1109/JEDS.2019.2897642
https://doi.org/10.1109/JEDS.2020.2971277
https://doi.org/10.1002/aelm.202200642
https://doi.org/10.1038/s41467-022-28459-6