Metrology / Characterisation – Page 3

Smart Systems Design, Characterisation and Prototyping Facility

Showroom Tyndall Devices / Test structures, Electrical, Magnetic, Mechanical, Metrology / Characterisation, Optical, Physical/Structural, Processing/Fabrication Connect, Power, Sustain, Think

This is a suite of test equipment that offers a turnkey electronics system design, manufacture,...

Access Provider / Facilities

Tyndall

High-Speed Communications Testbed

Showroom Tyndall Electrical, Metrology / Characterisation, Optical Short-range optical communications

Optical communications test-bed, incorporating the latest high speed arbitrary waveform generat...

Access Provider / Facilities

Tyndall

Photonic Circuits and Devices

Showroom NCSR Demokritos Devices / Test structures, Dielectric deposition, Dry etching, e-beam lithography, Metal deposition, Metrology / Characterisation, Modelling / Database, Optical, Optical lithography, Physical/Structural, Plasma etching, Processing/Fabrication, Wet etching Advanced sensing, Photonic sensing, Sense

Silicon nitride passive photonic elements, integrated circuits and devices operating in the VIS...

Access Provider / Facilities

NCSR Demokritos

Electrochemical analysis, Supercapacitor, Supercapattery, Electrochemical workstations

Showroom Tyndall Devices / Test structures, Electrical, Metrology / Characterisation, Physical/Structural, Processing/Fabrication Advanced sensing, Energy autonomy, Power, Sense

Electrochemical analysis of electrode materials for sensing and energy storage applications. Ac...

Access Provider / Facilities

Tyndall

Antenna and RF Test and Characterization Suite

Showroom Tyndall Devices / Test structures, Electrical, Magnetic, Mechanical, Metrology / Characterisation, Optical, Physical/Structural Connect, RF components, RF front-end design, Short-range optical communications

This is a suite of test equipment that is suitable for characterizing RF and Microwave circuits...

Access Provider / Facilities

Tyndall

Time domain diffuse optical spectrometer (450-1700 nm)

Showroom Tyndall Metrology / Characterisation, Optical, Others, Physical/Structural Advanced sensing, Green electronics and substrates, Green sensors, Hybrid SiP/SoC, Photonic sensing, Sense, Stretchable and flexible sensors, Sustain

Time domain diffuse optical spectrometer will characterize accurately the absorption and reduce...

Access Provider / Facilities

Tyndall

X-ray and ultraviolet photoelectron spectroscopy (XPS/UPS)

Showroom UNINOVA Electrical, Metrology / Characterisation, Physical/Structural Advanced sensing, Component Neuromorphic computing, Green electronics and substrates, Green sensors, Hybrid SiP/SoC, Photonic sensing, Quantum and spin devices engineering, Sense, Stretchable and flexible sensors, Sustain, Think

UNINOVA offers characterization of surfaces in terms of chemical (oxidation states) and element...

Access Provider / Facilities

UNINOVA

STEM Hitachi HF-5000

Showroom UNINOVA Metrology / Characterisation, Physical/Structural Advanced sensing, Green electronics and substrates, Green sensors, Sense, Sustain

The HF-5000 transmission electron microscope from Hitachi is a 200 kV aberration-corrected CFE ...

Access Provider / Facilities

UNINOVA

Scanning Electron Microscopy

Showroom UNINOVA Devices / Test structures, Electrical, Magnetic, Mechanical, Metrology / Characterisation, Optical, Physical/Structural Advanced sensing, Energy autonomy, Green electronics and substrates, Green sensors, Photonic sensing, Power, Power electronics, Sense, Stretchable and flexible sensors, Sustain

UNINOVA offers access to the entire value chain related to SEM analyses of different kinds of s...

Access Provider / Facilities

UNINOVA

Atomic Force Microscope (AFM)

Showroom UNINOVA Electrical, Magnetic, Mechanical, Metrology / Characterisation, Physical/Structural Advanced sensing, Component Neuromorphic computing, Energy autonomy, Green electronics and substrates, Green sensors, Power, Quantum and spin devices engineering, Sense, Stretchable and flexible sensors, Sustain, Think

An AFM works by quasi-physically probing a surface, allowing to generate not only topography im...

Access Provider / Facilities

UNINOVA

Smart Systems Design, Characterisation and Prototyping Facility

High-Speed Communications Testbed

Photonic Circuits and Devices

Electrochemical analysis, Supercapacitor, Supercapattery, Electrochemical workstations

Antenna and RF Test and Characterization Suite

Time domain diffuse optical spectrometer (450-1700 nm)

X-ray and ultraviolet photoelectron spectroscopy (XPS/UPS)

STEM Hitachi HF-5000

Scanning Electron Microscopy

Atomic Force Microscope (AFM)

Project details:

Contact: