SEM Archives - INFRACHIP

Tag Archive for: SEM

STEM Hitachi HF-5000

Showroom UNINOVA Metrology / Characterisation, Physical/Structural Advanced sensing, Green electronics and substrates, Green sensors, Sense, Sustain

The HF-5000 transmission electron microscope from Hitachi is a 200 kV aberration-corrected CFE ...

Access Provider / Facilities

UNINOVA

Scanning Electron Microscopy

Showroom UNINOVA Devices / Test structures, Electrical, Magnetic, Mechanical, Metrology / Characterisation, Optical, Physical/Structural Advanced sensing, Energy autonomy, Green electronics and substrates, Green sensors, Photonic sensing, Power, Power electronics, Sense, Stretchable and flexible sensors, Sustain

UNINOVA offers access to the entire value chain related to SEM analyses of different kinds of s...

Access Provider / Facilities

UNINOVA

Hybrid Chip-Integration Laboratory

Showroom WUT CEZAMAT Electrical, Mechanical, Metrology / Characterisation, Optical, Physical/Structural Hybrid SiP/SoC, Sustain

In this laboratory we offer electronic assembly with the use of our Finetech Flip-Chip Pico dev...

Access Provider / Facilities

WUT CEZAMAT

Cleanroom Characterization

Showroom Chalmers University Electrical, Mechanical, Metrology / Characterisation, Optical, Physical/Structural Connect, Power, Power electronics, Quantum and spin devices engineering, RF components, Think

Myfab Chalmers offers a range of characterization tools for fabricated devices. Scanning electr...

Access Provider / Facilities

Chalmers University

Project details:

TITLE: European Research Infrastructure on Semiconductor Chips

START-END: January 2024 – December2027
EU CONTRIBUTION: 14 457 463 €
TOPIC: HORIZON-INFRA-2023-SERV-01

Contact:

Coordinator: Tyndall National Institute

INFRACHIP (2024-2027) has received funding from the European Union’s Horizon Europe research and innovation actions under GA No. 101131822

Privacy Policy Legal Notice