Metrology / Characterisation Archives - Page 8 of 10

Transmission Electron Microscopy

Showroom INL Metrology / Characterisation, Physical/Structural Advanced sensing, Quantum and spin devices engineering, Sense, Think

Three (Scanning) Transmission Electron Microscopes are available at INL, with a wide range of c...

Access Provider / Facilities

INL

FIB-SEM System

Showroom INL Metrology / Characterisation, Physical/Structural Advanced sensing, Component Neuromorphic computing, Energy autonomy, Photonic sensing, Power, Quantum and spin devices engineering, Sense, Stretchable and flexible sensors, Think

A tool that combines a Scanning Electron Microscope (SEM) and a Focused Ion Beam (FIB) capabili...

Access Provider / Facilities

INL

Magnetic Material Characterisation

Showroom CNRS-FMNT Devices / Test structures, Electrical, Magnetic, Metrology / Characterisation, Optical Advanced sensing, Connect, Green sensors, Quantum and spin devices engineering, RF components, Sense, Sustain, Think

Magnetic Material Characterisation - SPINCarac offers a suit of equipment dedicated to characte...

Access Provider / Facilities

CNRS-FMNT

Molecular Beam Epitaxy (MBE) for spintronics

Showroom CNRS-FMNT Dielectric deposition, Metal deposition, Metrology / Characterisation, Others, Physical/Structural, Plasma etching, Processing/Fabrication Advanced sensing, Green electronics and substrates, Quantum and spin devices engineering, Sense, Sustain, Think

Molecular Beam Epitaxy (MBE) for spintronics - the SPIN2D platform consists in a cluster of Mol...

Access Provider / Facilities

CNRS-FMNT

FIB-STEM

Showroom CNRS-FMNT Metrology / Characterisation, Physical/Structural Component Neuromorphic computing, Connect, Energy autonomy, Hybrid SiP/SoC, PMU design, Power, Power electronics, Quantum and spin devices engineering, RF components, RF front-end design, Short-range optical communications, Sustain, Think

This tool consists of a scanning electronic microscope SEM equipped with a focalized ion beam F...

Access Provider / Facilities

CNRS-FMNT

Physico-chemical Characterisation

Showroom CNRS-FMNT Dielectric deposition, Dry etching, e-beam lithography, Electrical, Magnetic, Mechanical, Metal deposition, Metrology / Characterisation, Optical, Optical lithography, Physical/Structural, Plasma etching, Processing/Fabrication, Wet etching Advanced sensing, Connect, Energy autonomy, Green electronics and substrates, Green sensors, Hybrid SiP/SoC, Photonic sensing, Power, Power electronics, RF components, RF front-end design, Sense, Short-range optical communications, Stretchable and flexible sensors, Sustain

The Physico-chemical Characterisation - IMPACT platform integrates several physico-chemical ch...

Access Provider / Facilities

CNRS-FMNT

RF-optical Characterisation

Showroom CNRS-FMNT Metrology / Characterisation, Optical Photonic sensing, Sense

The bench is dedicated to RF characterizations of optoelectronic devices (lasers, modulators, d...

Access Provider / Facilities

CNRS-FMNT

Terahertz characterisation

Showroom CNRS-FMNT Electrical, Magnetic, Mechanical, Metrology / Characterisation, Optical, Physical/Structural Advanced sensing, Component Neuromorphic computing, Connect, Energy autonomy, Green electronics and substrates, Green sensors, Hybrid SiP/SoC, Photonic sensing, PMU design, Power, Power electronics, Quantum and spin devices engineering, RF components, RF front-end design, Sense, Short-range optical communications, Stretchable and flexible sensors, Sustain, Think

Terahertz characterisation - PLATERA platform: Terahertz (50 GHz – 4 THz) characterization an...

Access Provider / Facilities

CNRS-FMNT

Mode profile measurement

Showroom CNRS-FMNT Metrology / Characterisation, Optical Photonic sensing, Sense

This bench is dedicated to measuring the mode profile of integrated waveguides...

Access Provider / Facilities

CNRS-FMNT

Thin-film Characterisation

Showroom CNRS-FMNT Metrology / Characterisation, Optical, Physical/Structural Photonic sensing, Sense

Thin-film Characterisation - m-line bench. This bench is used to characterize the thickness and...

Access Provider / Facilities

CNRS-FMNT

Transmission Electron Microscopy

FIB-SEM System

Magnetic Material Characterisation

Molecular Beam Epitaxy (MBE) for spintronics

FIB-STEM

Physico-chemical Characterisation

RF-optical Characterisation

Terahertz characterisation

Mode profile measurement

Thin-film Characterisation

Project details:

Contact: