Environmental Scanning Electron Microscope

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A highly versatile scanning electron microscope that is used to chemically and structurally cha...
Access Provider / Facilities
INL

RF-optical Characterisation

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The bench is dedicated to RF characterizations of optoelectronic devices (lasers, modulators, d...
Access Provider / Facilities
CNRS-FMNT

Thin-film Characterisation

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Thin-film Characterisation - m-line bench. This bench is used to characterize the thickness and...
Access Provider / Facilities
CNRS-FMNT