FIB-STEM
Showroom CNRS-FMNT Metrology / Characterisation, Physical/Structural Component Neuromorphic computing, Connect, Energy autonomy, Hybrid SiP/SoC, PMU design, Power, Power electronics, Quantum and spin devices engineering, RF components, RF front-end design, Short-range optical communications, Sustain, ThinkThis tool consists of a scanning electronic microscope SEM equipped with a focalized ion beam F...
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CNRS-FMNT
Physico-chemical Characterisation
Showroom CNRS-FMNT Dielectric deposition, Dry etching, e-beam lithography, Electrical, Magnetic, Mechanical, Metal deposition, Metrology / Characterisation, Optical, Optical lithography, Physical/Structural, Plasma etching, Processing/Fabrication, Wet etching Advanced sensing, Connect, Energy autonomy, Green electronics and substrates, Green sensors, Hybrid SiP/SoC, Photonic sensing, Power, Power electronics, RF components, RF front-end design, Sense, Short-range optical communications, Stretchable and flexible sensors, SustainThe Physico-chemical Characterisation - IMPACT platform integrates several physico-chemical ch...
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CNRS-FMNT
Terahertz characterisation
Showroom CNRS-FMNT Electrical, Magnetic, Mechanical, Metrology / Characterisation, Optical, Physical/Structural Advanced sensing, Component Neuromorphic computing, Connect, Energy autonomy, Green electronics and substrates, Green sensors, Hybrid SiP/SoC, Photonic sensing, PMU design, Power, Power electronics, Quantum and spin devices engineering, RF components, RF front-end design, Sense, Short-range optical communications, Stretchable and flexible sensors, Sustain, ThinkTerahertz characterisation - PLATERA platform: Terahertz (50 GHz – 4 THz) characterization an...
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CNRS-FMNT
Insulating Material Characterization
Showroom CNRS-FMNT Devices / Test structures, Electrical, Metrology / Characterisation Advanced sensing, Component Neuromorphic computing, Energy autonomy, Green electronics and substrates, Green sensors, Power, Sense, Stretchable and flexible sensors, Sustain, ThinkThis test bench is dedicated for characterizing the electrical properties of insulators within ...
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CNRS-FMNT
Test & Characterization Platform
Showroom CNRS-FMNT Devices / Test structures, Electrical, Magnetic, Mechanical, Metrology / Characterisation, Modelling / Database, Optical, Physical/Structural Advanced sensing, Connect, Energy autonomy, Green electronics and substrates, Green sensors, Photonic sensing, Power, Power electronics, RF components, RF front-end design, Sense, Stretchable and flexible sensors, SustainTest and Characterisation Platform - Electrical, optical and physical characterization of mater...
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CNRS-FMNT
Thermal Characterisation Test Bench
Showroom CNRS-FMNT Electrical, Metrology / Characterisation Energy autonomy, PMU design, Power, Power electronicsThermal Characterisation Test Bench CATHELINN - This test bench is dedicated to the thermal cha...
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CNRS-FMNT
Power Electronics probe station
Showroom CNRS-FMNT Devices / Test structures, Electrical, Metrology / Characterisation Power, Power electronicsPower Electronics probe station - CARAPACE is a Janis probe test station with Agilent B1505A Tr...
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CNRS-FMNT
1D & 2D mechanical test bench
Showroom CNRS-FMNT Devices / Test structures, Electrical, Magnetic, Mechanical, Metrology / Characterisation, Optical, Physical/Structural Energy autonomy, PMU design, Power, Power electronicsBench for characterizing the mechanical behavior of materials subjected to uniaxial or biaxial ...
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CNRS-FMNT
Cleanroom Characterization
Showroom Chalmers University Electrical, Mechanical, Metrology / Characterisation, Optical, Physical/Structural Connect, Power, Power electronics, Quantum and spin devices engineering, RF components, ThinkMyfab Chalmers offers a range of characterization tools for fabricated devices. Scanning electr...
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Chalmers University
Automatized characterization
Showroom Chalmers University Metrology / Characterisation, Optical, Physical/Structural Connect, Power, Power electronics, Quantum and spin devices engineering, RF components, ThinkMyfab Chalmers offers optical and electron microscopy tools for automatized morphological chara...
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Chalmers University