This author has not written his bio yet.
But we are proud to say that devinf20 contributed 103 entries already.
This platform is dedicated to the analysis and characterization, on a wide band of frequency, of electronic and microelectronic devices such as: on wafer integrated circuits (2D, 3D) and on printed circuits board (PCB) devices. Actives and passives components, solid materials and liquids are analysed and characterized.
A test bench dedicated to security characterization through electromagnetic fault injection on integrated circuits.
Test and Characterisation Platform – Electrical, optical and physical characterization of materials and devices at multi-levels, supported by physics-based modelling
Thermal Characterisation Test Bench CATHELINN – This test bench is dedicated to the thermal characterization of power devices based on the use of thermo-sensitive electrical parameters.
Power Electronics probe station – CARAPACE is a Janis probe test station with Agilent B1505A Tracer and B1513A – B1512A – B1520A – B1510A module for static characterization of power components at different temperatures.
Bench for characterizing the mechanical behavior of materials subjected to uniaxial or biaxial mechanical stress.
We offer a complete processing platform for fabrication of both low-Tc and high-Tc superconducting circuits for quantum technology applications. This includes growth of thin films by sputtering and electron beam evaporation, high-resolution electron beam lithography, plasma and reactive ion-beam dry etching, and advanced characterization of materials and devices.
We offer a complete platform for fabrication of complex perovskite-based oxide devices, including growth of thin films by pulsed laser deposition or sputtering, patterning using electron-beam lithography or direct laser writing, as well as ion beam etching using hard carbon masks. Wide range of materials is available for various applications, including ferroelectric, ferromagnetic, multiferroic and other functional Perovskite oxide materials.
Myfab Chalmers offers a range of characterization tools for fabricated devices. Scanning electron microscope (SEM), Atomic Force microscope (AFM), Spectroscopic Ellipsometer, Raman microscope, Optical microscope, Optical and stylus profilometer, White Light reflectometer.
Myfab Chalmers offers optical and electron microscopy tools for automatized morphological characterization. 2D and 3D Images at specific positions can be collected for process control, recursive optimization, and automatized measurements of specific feature sizes.
TITLE: European Research Infrastructure on Semiconductor Chips
START-END: January 2024 – December2027
EU CONTRIBUTION: 14 457 463 €
TOPIC: HORIZON-INFRA-2023-SERV-01
Coordinator: Tyndall National Institute
INFRACHIP (2024-2027) has received funding from the European Union’s Horizon Europe research and innovation actions under GA No. 101131822
This website uses cookies! We use cookies to personalise your experience. To find out more on the data we collect please refer to our privacy policy.
OKLearn MoreWe may request cookies to be set on your device. We use cookies to let us know when you visit our websites, how you interact with us, to enrich your user experience, and to customize your relationship with our website.
Click on the different category headings to find out more. You can also change some of your preferences. Note that blocking some types of cookies may impact your experience on our websites and the services we are able to offer.
These cookies are strictly necessary to provide you with services available through our website and to use some of its features.
Because these cookies are strictly necessary to deliver the website, you cannot refuse them without impacting how our site functions. You can block or delete them by changing your browser settings and force blocking all cookies on this website.
These cookies collect information that is used either in aggregate form to help us understand how our website is being used or how effective our marketing campaigns are, or to help us customize our website and application for you in order to enhance your experience.
If you do not want that we track your visist to our site you can disable tracking in your browser here:
We also use different external services like Google Webfonts, Google Maps and external Video providers. Since these providers may collect personal data like your IP address we allow you to block them here. Please be aware that this might heavily reduce the functionality and appearance of our site. Changes will take effect once you reload the page.
Google Webfont Settings:
Google Map Settings:
Vimeo and Youtube video embeds:
You can read about our cookies and privacy settings in detail on our Privacy Policy page.