Component Neuromorphic computing Archives - Page 6 of 7

FIB-SEM System

Showroom INL Metrology / Characterisation, Physical/Structural Advanced sensing, Component Neuromorphic computing, Energy autonomy, Photonic sensing, Power, Quantum and spin devices engineering, Sense, Stretchable and flexible sensors, Think

A tool that combines a Scanning Electron Microscope (SEM) and a Focused Ion Beam (FIB) capabili...

Access Provider / Facilities

INL

Etching Processes

Showroom INL Dry etching, Plasma etching, Processing/Fabrication, Wet etching Advanced sensing, Component Neuromorphic computing, Energy autonomy, Photonic sensing, Power, Quantum and spin devices engineering, Sense, Stretchable and flexible sensors, Think

The INL Cleanroom offers a comprehensive set of equipment for etching silicon, metal and dielec...

Access Provider / Facilities

INL

Environmental Scanning Electron Microscope

Showroom INL Advanced sensing, Component Neuromorphic computing, Energy autonomy, Photonic sensing, Power, Quantum and spin devices engineering, Sense, Stretchable and flexible sensors, Think

A highly versatile scanning electron microscope that is used to chemically and structurally cha...

Access Provider / Facilities

INL

Deposition Processes

Showroom INL Dielectric deposition, Metal deposition, Processing/Fabrication Advanced sensing, Component Neuromorphic computing, Energy autonomy, Photonic sensing, Power, Quantum and spin devices engineering, Sense, Stretchable and flexible sensors, Think

The INL Cleanroom offers a comprehensive set of equipment for thin-film deposition by PVD and C...

Access Provider / Facilities

INL

FIB-STEM

Showroom CNRS-FMNT Metrology / Characterisation, Physical/Structural Component Neuromorphic computing, Connect, Energy autonomy, Hybrid SiP/SoC, PMU design, Power, Power electronics, Quantum and spin devices engineering, RF components, RF front-end design, Short-range optical communications, Sustain, Think

This tool consists of a scanning electronic microscope SEM equipped with a focalized ion beam F...

Access Provider / Facilities

CNRS-FMNT

Terahertz characterisation

Showroom CNRS-FMNT Electrical, Magnetic, Mechanical, Metrology / Characterisation, Optical, Physical/Structural Advanced sensing, Component Neuromorphic computing, Connect, Energy autonomy, Green electronics and substrates, Green sensors, Hybrid SiP/SoC, Photonic sensing, PMU design, Power, Power electronics, Quantum and spin devices engineering, RF components, RF front-end design, Sense, Short-range optical communications, Stretchable and flexible sensors, Sustain, Think

Terahertz characterisation - PLATERA platform: Terahertz (50 GHz – 4 THz) characterization an...

Access Provider / Facilities

CNRS-FMNT

Insulating Material Characterization

Showroom CNRS-FMNT Devices / Test structures, Electrical, Metrology / Characterisation Advanced sensing, Component Neuromorphic computing, Energy autonomy, Green electronics and substrates, Green sensors, Power, Sense, Stretchable and flexible sensors, Sustain, Think

This test bench is dedicated for characterizing the electrical properties of insulators within ...

Access Provider / Facilities

CNRS-FMNT

Quantum superconducting circuits

Showroom Chalmers University Dielectric deposition, Dry etching, e-beam lithography, Metal deposition, Optical lithography, Plasma etching, Processing/Fabrication Component Neuromorphic computing, Quantum and spin devices engineering, Think

We offer a complete processing platform for fabrication of both low-Tc and high-Tc superconduct...

Access Provider / Facilities

Chalmers University

Complex oxide electronics

Showroom Chalmers University Dielectric deposition, e-beam lithography, Metrology / Characterisation, Optical lithography, Physical/Structural, Processing/Fabrication Component Neuromorphic computing, Quantum and spin devices engineering, Think

We offer a complete platform for fabrication of complex perovskite-based oxide devices, includi...

Access Provider / Facilities

Chalmers University

Wet Chemistry

Showroom AMO GmbH Devices / Test structures, Dielectric deposition, Dry etching, e-beam lithography, Electrical, Magnetic, Mechanical, Metal deposition, Metrology / Characterisation, Modelling / Database, Optical, Optical lithography, Physical/Structural, Plasma etching, Processing/Fabrication, Wet etching Advanced sensing, Component Neuromorphic computing, Connect, Photonic sensing, Quantum and spin devices engineering, RF components, RF front-end design, Sense, Short-range optical communications, Stretchable and flexible sensors, Think

Wet bench for imprint processes: Arias Lithography wet bench: Arias Standard cleaning: Arias ...

Access Provider / Facilities

AMO GmbH

FIB-SEM System

Etching Processes

Environmental Scanning Electron Microscope

Deposition Processes

FIB-STEM

Terahertz characterisation

Insulating Material Characterization

Quantum superconducting circuits

Complex oxide electronics

Wet Chemistry

Project details:

Contact: