RF-optical Characterisation

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The bench is dedicated to RF characterizations of optoelectronic devices (lasers, modulators, d...
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CNRS-FMNT

Thin-film Characterisation

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Thin-film Characterisation - m-line bench. This bench is used to characterize the thickness and...
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CNRS-FMNT

1D & 2D mechanical test bench

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Bench for characterizing the mechanical behavior of materials subjected to uniaxial or biaxial ...
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CNRS-FMNT

Cleanroom Characterization

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Myfab Chalmers offers a range of characterization tools for fabricated devices. Scanning electr...
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Chalmers University