Physical/Structural Archives - Page 6 of 7

FIB-STEM

Showroom CNRS-FMNT Metrology / Characterisation, Physical/Structural Component Neuromorphic computing, Connect, Energy autonomy, Hybrid SiP/SoC, PMU design, Power, Power electronics, Quantum and spin devices engineering, RF components, RF front-end design, Short-range optical communications, Sustain, Think

This tool consists of a scanning electronic microscope SEM equipped with a focalized ion beam F...

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CNRS-FMNT

Physico-chemical Characterisation

Showroom CNRS-FMNT Dielectric deposition, Dry etching, e-beam lithography, Electrical, Magnetic, Mechanical, Metal deposition, Metrology / Characterisation, Optical, Optical lithography, Physical/Structural, Plasma etching, Processing/Fabrication, Wet etching Advanced sensing, Connect, Energy autonomy, Green electronics and substrates, Green sensors, Hybrid SiP/SoC, Photonic sensing, Power, Power electronics, RF components, RF front-end design, Sense, Short-range optical communications, Stretchable and flexible sensors, Sustain

The Physico-chemical Characterisation - IMPACT platform integrates several physico-chemical ch...

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CNRS-FMNT

Terahertz characterisation

Showroom CNRS-FMNT Electrical, Magnetic, Mechanical, Metrology / Characterisation, Optical, Physical/Structural Advanced sensing, Component Neuromorphic computing, Connect, Energy autonomy, Green electronics and substrates, Green sensors, Hybrid SiP/SoC, Photonic sensing, PMU design, Power, Power electronics, Quantum and spin devices engineering, RF components, RF front-end design, Sense, Short-range optical communications, Stretchable and flexible sensors, Sustain, Think

Terahertz characterisation - PLATERA platform: Terahertz (50 GHz – 4 THz) characterization an...

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CNRS-FMNT

Thin-film Characterisation

Showroom CNRS-FMNT Metrology / Characterisation, Optical, Physical/Structural Photonic sensing, Sense

Thin-film Characterisation - m-line bench. This bench is used to characterize the thickness and...

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CNRS-FMNT

Hyperfrequency Characterisation Platform

Showroom CNRS-FMNT Devices / Test structures, Electrical, Magnetic, Mechanical, Metrology / Characterisation, Optical, Physical/Structural Connect, Green electronics and substrates, Green sensors, Hybrid SiP/SoC, RF components, RF front-end design, Sustain

This platform is dedicated to the analysis and characterization, on a wide band of frequency, o...

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CNRS-FMNT

Test & Characterization Platform

Showroom CNRS-FMNT Devices / Test structures, Electrical, Magnetic, Mechanical, Metrology / Characterisation, Modelling / Database, Optical, Physical/Structural Advanced sensing, Connect, Energy autonomy, Green electronics and substrates, Green sensors, Photonic sensing, Power, Power electronics, RF components, RF front-end design, Sense, Stretchable and flexible sensors, Sustain

Test and Characterisation Platform - Electrical, optical and physical characterization of mater...

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CNRS-FMNT

1D & 2D mechanical test bench

Showroom CNRS-FMNT Devices / Test structures, Electrical, Magnetic, Mechanical, Metrology / Characterisation, Optical, Physical/Structural Energy autonomy, PMU design, Power, Power electronics

Bench for characterizing the mechanical behavior of materials subjected to uniaxial or biaxial ...

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CNRS-FMNT

Complex oxide electronics

Showroom Chalmers University Dielectric deposition, e-beam lithography, Metrology / Characterisation, Optical lithography, Physical/Structural, Processing/Fabrication Component Neuromorphic computing, Quantum and spin devices engineering, Think

We offer a complete platform for fabrication of complex perovskite-based oxide devices, includi...

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Chalmers University

Cleanroom Characterization

Showroom Chalmers University Electrical, Mechanical, Metrology / Characterisation, Optical, Physical/Structural Connect, Power, Power electronics, Quantum and spin devices engineering, RF components, Think

Myfab Chalmers offers a range of characterization tools for fabricated devices. Scanning electr...

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Chalmers University

Automatized characterization

Showroom Chalmers University Metrology / Characterisation, Optical, Physical/Structural Connect, Power, Power electronics, Quantum and spin devices engineering, RF components, Think

Myfab Chalmers offers optical and electron microscopy tools for automatized morphological chara...

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Chalmers University

FIB-STEM

Physico-chemical Characterisation

Terahertz characterisation

Thin-film Characterisation

Hyperfrequency Characterisation Platform

Test & Characterization Platform

1D & 2D mechanical test bench

Complex oxide electronics

Cleanroom Characterization

Automatized characterization

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