Atomic Force Microscope
Bruker Atomic Force Microscope (AFM) – Dimension Icon
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Bruker Atomic Force Microscope (AFM) – Dimension Icon
Access to Tyndall FlexiFab Clean Room for non-standard processing
MPI High Power Semi-Automatic Probe Station (Model MPI TS3000 HP)
Superconducting Quantum Interference Device (SQUID). MPMS (Magnetic Property Measurement System) is a highly sensitive SQUID magnetometer generally used to measure magnetic moments as function of applied magnetic field or temperature.
AMO offers the fabrication of graphene devices (GFETs) for sensor applications. Users can obtain customised graphene devices on chip-scale as well as on 6” or 8” wafers. Electrical characterization on wafer scale can be offered additionally.
INFRACHIP is now accepting applications for Transnational Access
HyperPath is a software solution for enabling secure and reliable wireless connectivity for challenging use cases such as BVLOS drones, Industry 4.0 and mission-critical IoT (e.g. medical devices)
Finally, the long awaited INFRACHIP showroom is now accessible, with more than 100 available sets of equipment and technologies! Transnational Access calls will start imminently. Interested parties will be able to apply for a EU sponsored (=no cost) access to the displayed technologies. How does it work? Depending on your research topic or work, you […]
Vector Network Analyser capable of performing measurements up to 400 GHz. The VNA is natively capable of performing measurements from 10 MHz up to 67 GHz in a continuous fashion, and in a banded mode from 67 GHz up to 400 GHz: a) 67 GHz – 115 GHz, b) 110 GHz-170 GHz, c) 170 GHz – 260 GHz and d) 260 GHz – 400 GHz.
Antenna chamber for measurements of antenna radiation characteristics, with a minimum frequency of operation of 20 GHz.
In this laboratory we offer electronic assembly with the use of our Finetech Flip-Chip Pico device. Our equipment and materials allow for use of low temperature joining technique. Mechanical properties testing, thermal shock chamber and SEM imaging allow for an in-depth analysis of the fabricated devices.